RAiM 2025: The First International Workshop on Resilient Artificial Intelligence for Manufacturing (ICDM’25)
Date: Wednesday, November 12, 2025
Time: 8:30-12:30 AM Eastern Time
Location: Capital Hilton (Room: New York), Washington DC, USA
Introduction
RAiM 2025: The 1st International Workshop on Resilient Artificial Intelligence for Manufacturing will be held as a half-day, in-person workshop at the 25th IEEE International Conference on Data Mining (ICDM 2025) in Washington, D.C., USA, on November 12, 2025. RAiM aims to comprehensively address the implications of Artificial Intelligence resilience in Manufacturing Industrial Internet. Despite progress in industrial AI, key challenges remain in maintaining robust performance, such as ensuring resilience to disruptions, detecting failures, adapting in real-time, and recovering from threats like poor data quality or cyberattacks. The RAiM 2025 workshop will integrate expertise in academia and industry to promote original, transdisciplinary research exploring how Artificial Intelligence and Machine Learning can be resiliently trained and deployed in manufacturing, with potential applications in infrastructure, healthcare, energy, human-machine systems, financial technology, etc.
Registration is TBD! Scan the OR Code for Early Bird/IEEE Member Discount.
Scope of Topics
We invite submissions of research papers that address, but are not limited to, the following areas:
- Foundation models in manufacturing.
- Reliability/resilience of manufacturing AI models.
- AI model robustness and uncertainty quantification.
- Data quality and data sharing.
- Monitoring, diagnosis, and mitigation strategies for AI resilience.
- Human-in-the-loop AI systems in manufacturing.
- Cyber resilience in other applications.
- Development of benchmarks/datasets and open-source AI tools for manufacturing AI modeling.
Keynote Session and Panel Discussion
The half‑day program will feature:
- A keynote by leading academics/industry experts
- A panel discussion on open challenges and future directions
- Peer‑reviewed paper oral presentations
Submission Format Requirements
- Paper length: up to 8 pages of content + up to 2 extra pages for references and appendices (maximum 10 pages total).
- Template: following ICDM 2025 guideline.
- ICDM has imposed a triple-blind submission and review policy for all submissions.
- Review: Papers will be peer-reviewed and selected for invited or poster presentations.
- Originality: Submissions must be original and not under consideration elsewhere. Duplicate submissions to multiple ICDM workshops are prohibited.
- Proceedings: Accepted papers will appear in the IEEE ICDM 2025 Workshop Proceedings (ICDMW) and in IEEE Xplore.
How to Submit
Submit your manuscript as a PDF through the ICDM 2025 Workshop CyberChair portal (Submission Link). Select “RAiM 2025 Workshop” when choosing the submission track.
Important Dates
- Paper Submission Deadline:
September 1, 2025September 7, 2025 (Deadline Extended) - Author Notification: September 15, 2025
- Camera‑Ready & Copyright: September 25, 2025
- Workshop Date: November 12, 2025
Attendance & Registration Policy
At least one author must register for the full conference and present the paper in person. Authors who need a U.S. visa should begin the application process early. ICDM does not provide online streaming due to venue constraints.
Program Agenda
Below is our program schedule. We look forward to seeing everyone at the workshop in DC!
| Nov. 12th | Session | Title | Presenters/Authors |
|---|---|---|---|
| 8:30 AM - 9:15 AM | Paper Presentation I | Measuring Resilience from Cascading Transfer Learning in Manufacturing Systems | Tyler Cody and Peter Beling |
| Contrastive Ensemble Active Learning for Data Quality Improvements for Resilient Manufacturing AI Model Prediction | Xuancheng Jin, Yingyan Zeng, Hui Liu, and Ran Jin | ||
| Robust Analysis for Resilient AI System | Yu Wang, Ran Jin, and Lulu Kang | ||
| 9:15 AM - 10:00 AM | Keynote | Prof. Haitao Liao | |
| 10:00 AM - 10:30 AM | Coffee Break | ||
| 10:30 AM - 11:30 AM | Panel Discussion | Speakers from NSF, NIST, IMF, and Prof. Peter Beling | |
| 11:30 AM - 12:15 PM | Paper Presentation II | Integrating Vision Language, and Actions in Optical Inspections to Enable Closed-Loop Defect Identification and Remediation | Xiaodong Jia, Tarek Yahia, Kody Haubeil, David Siegel, and Donald Davis |
| A Reproducible Approach to Virtual Metrology | Jimmy Pöhlmann, Anna Lopatkina, Paul Jungmann, Claudio Hartmann, and Wolfgang Lehner | ||
| Human Digital Twin, Precision Healthcare, Health Monitoring, Anomaly Detection, Statistical and Machine Learning Models | Rong Pan, Hongyue Sun, Xiaoyu Chen, Giulia Pedrielli, and Jiapeng Huang | ||
| Proposing a Framework for Machine Learning Adoption on Legacy Systems | Ashiqur Rahman and Hamed Alhoori |
Program Co-Chairs
- Ran Jin, Virginia Tech
- Ismini Lourentzou, University of Illinois Urbana‑Champaign
- Xuan Wang, Virginia Tech
- Yingyan Zeng, University of Cincinnati
Join us in shaping the future of resilient AI for manufacturing by contributing your latest research to RAiM 2025. We look forward to receiving your submissions and to an engaging, interactive workshop at IEEE ICDM 2025. For any questions about scope, submissions, or logistics, please reach out to the Workshop Organizers at raim2025-idcm@outlook.com.